Support >
  About cybersecurity >
  How can customized chips improve data center power efficiency and effectiveness evaluation
How can customized chips improve data center power efficiency and effectiveness evaluation
Time : 2024-11-20 15:18:37
Edit : Jtti

Customized chips are designed to optimize data center security and power efficiency, and at present, customized chips have obvious effects on optimizing data center security and efficiency, as follows!

In terms of security, customized astrodisks such as ASI support special needs, with small size, low energy consumption, high computing performance, high computing efficiency advantages, in addition to customized chips such as ACDC chip also built-in multi-level security functions and encryption technology, effectively protect data center privacy and security, can well prevent data leaks and hacker attacks.

In terms of power efficiency, customized chips can be optimized for specific tasks to improve power efficiency. For example, the computing power and computing efficiency of ASIC chips can be customized by algorithms. There are also chips that enable servers to run storage jobs and loads at four times the performance of existing servers, while reducing power consumption by three times. It significantly reflects the important role of customized chips in improving the power efficiency of data centers.

In terms of performance improvement, the custom chip integrates multiple components of the traditional server into one piece, with high-speed Ethernet and PCle interfaces and network and storage engines, data accelerators and security features, which greatly improve the performance of the data center.

If you need to evaluate the power efficiency improvement of your chip, follow these steps!

It is necessary to determine the evaluation standards and indicators, according to the data center energy efficiency limit value and energy efficiency level, the energy efficiency limit value of the data center is lower than or equal to the number of indicators of its energy efficiency level 3, the design value of the data center power ratio and the measured value are in line with the corresponding level provisions, and the measured value throughout the year will be lower than the corresponding design value of 1.05 times. Evaluation indicators such as PUE and EEUE are based on the idea of dividing the total resources by the resources consumed by IT. A smaller PUE indicates a higher energy efficiency.

/uploads/images/202411/20/04b82c9bf2b8e7ac747e8ccd9332f0ad.jpg  

The measured value test method can adopt the data center energy efficiency test method to measure the energy efficiency of the data center at five characteristic working conditions, and then calculate the energy efficiency value of the data center by weighting the temperature coefficient of the region where the data center is located throughout the year.

The measured value is the Vin(input voltage), Vout(output voltage), lin(input current), lout(output current) values (or Pout and Pin) that need to be measured when measuring efficiency to complete the calculation and get the final result.

The most common efficiency measurement method is the four-meter method, using four multimeters to measure the above four parameters, using the current file to connect the multimeter in series in the circuit, pay attention to the current flow, using the voltage file to take parallel in the circuit, pay attention to the positive and negative poles.

The measured results are summarized to calculate the final result, which can be formed in a report form and compared with other chips, usually with an efficiency curve.

If the efficiency test results are not up to standard, the efficiency can be optimized and improved by replacing the device, reducing the inductive DCR and capacitive ESR.

For DC-DC converters, the efficiency curves of different components can be compared to perform loss analysis and find out the main factors that affect the efficiency, such as the drain-source on-resistance and reverse recovery charge of the MOSFET.

The above are the systematic steps for evaluating the power efficiency of a custom chip, and the output results can be used for further optimization.

JTTI-Defl
JTTI-COCO
JTTI-Selina
JTTI-Ellis
JTTI-Eom